Работы, цитирующие эту работу

Работ: 2

Работа: The Relevance of Point Defects in Studying Silica-Based Materials from Bulk to Nanosystems

1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition

   U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +4

   СтатьяSemiconductor materials and devicesThin Solid Films2021Цитирований: 13

   ABIABI:AkademIndex/openalex/2026.other.144461

2. Review of Experimental and Theoretical Works on Defect Formation in Wide-Gap Crystals

   Utkirjon Sharopov

   ГлаваZnO doping and propertiesSpringerBriefs in materials2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.chapter.000290