Перейти к основному содержанию
AkademIndex

Продукты

Для разработчиков

AkademBaseОткрытый API экосистемы
Статья

Electron microprobe X-ray spectral analysis of CMBD CdTe films of different composition

T.M. RazykovFlorida State University, Tallahassee, USATravis J. AndersonFlorida State University, Tallahassee, USAR. AcherFlorida State University, Tallahassee, USAV. CrasiunFlorida State University, Tallahassee, USAO. CrisaleFlorida State University, Tallahassee, USAY. GoswamiFlorida State University, Tallahassee, USAК. M. KuchkarovFlorida State UniversityS. LiFlorida State University, Tallahassee, USAS. WijayaghawanFlorida State University, Tallahassee, USAB. A. ErgashevFlorida State University, Tallahassee, USA
Applied Solar Energyjournal2009en
ABI

Аннотация

X-ray structural and scanning electron microscope analyses show that the difference in the growth of the grains obtained by chemical molecular beam deposition (CMBD) depends on the sample composition. The Cd-enriched samples were of poor quality, while the samples grown at close stoichiometries were polycrystalline, had large grain size, and were uniform in their thickness.

Перевод пока недоступен

Темы

Идентификаторы

Цитирования и источники