Работы, цитирующие эту работу

Работ: 2

Работа: RuO 2 -based thick film resistors studied by extended x-ray absorption spectroscopy

1. High‐temperature anomalies in resistivity and thermoelectric power of thick‐film resistors and their conduction mechanism

   G. Abdurakhmanov, N. G. Abdurakhmanova

   СтатьяElectrical and Thermal Properties of Materialsphysica status solidi (a)2005Цитирований: 7

   ABIABI:AkademIndex/openalex/2005.article.000069

2. Interaction of RuO<sub>2</sub> and Lead-Silicate Glass in Thick-Film Resistors

   G. Abdurakhmanov, G. S. Vakhidova, Lutfullo X. Tursunov

   СтатьяElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics2011Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.495414