Работы, цитирующие эту работу

Работ: 2

Работа: Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions

1. Sputtering of GaAs target under Bi+ cluster ions bombardment

   Sh.Dj. Akhunov, G.P. Kakhramonova, Sh.M. Axmedov +2

   СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2022Цитирований: 1

   ABIABI:AkademIndex/openalex/2022.article.000824

2. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

   Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

   СтатьяIon-surface interactions and analysisSurface and Interface Analysis2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.008231