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Работ: 2
Работа: Oxidation of Sn Thin Films to SnO<sub>2</sub>. Micro-Raman Mapping and X-ray Diffraction Studies
Disordered Tin Oxide Films for Thermoelectric Applications: Correlation between Microstructure, Electrical Conductivity and Seebeck Coefficient
V.K. Ksenevich, V.A. Dorosinets, M. V. Samarina +4
СтатьяAdvanced Thermoelectric Materials and DevicesDevices and Methods of Measurements2025Цитирований: 0ABI