Analysis of Porous Nanosilicon by Raman Spectroscopy
V. M. RotshteynInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, UzbekistanT. K. TurdalievInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, UzbekistanХ. Б. АшуровInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan
ABI
Аннотация
Аннотация отсутствует.