Работы, цитирующие эту работу

Работ: 3

Работа: Chemical and Piezoresistive Microanalyses at the Interface of RuO ₂ –Glass Diffusion Pairs

1. On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors). 3. The Minimum of Temperature Dependence of Resistivity

   G. Abdurakhmanov

   СтатьяElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics2014Цитирований: 5

   ABIABI:AkademIndex/openalex/2026.other.405405

2. Impact of Ruthenium Diffusion on the Electrical Properties of Thick Film Resistors

   Avazbek T. Dekhkonov, G. Abdurakhmanov, Mukhriddin E. Tursunov +5

   СтатьяElectrical and Thermal Properties of MaterialsEast European Journal of Physics2025Цитирований: 1

   ABIABI:AkademIndex/openalex/2025.article.002402

3. Intrinsic Electrical Conductivity of Silicate Glass Doped with Ruthenium Dioxide: Experimental Evidence

   G. Abdurakhmanov, Avazbek T. Dekhkonov, Mukhriddin E. Tursunov

   СтатьяElectrical and Thermal Properties of Materialsphysica status solidi (b)2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.002451