Работы, цитирующие эту работу

Работ: 3

Работа: Microstructural Analysis and Transport Properties of RuO₂-Based Thick Film Resistors

1. On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors). 3. The Minimum of Temperature Dependence of Resistivity

   G. Abdurakhmanov

   СтатьяElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics2014Цитирований: 5

   ABIABI:AkademIndex/openalex/2026.other.405405

2. Interaction of RuO<sub>2</sub> and Lead-Silicate Glass in Thick-Film Resistors

   G. Abdurakhmanov, G. S. Vakhidova, Lutfullo X. Tursunov

   СтатьяElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics2011Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.495414

3. Effect of Glass Composition on the Thermal Expansion of Relict Crystals of RuO<sub>2</sub> in Doped Lead-Silicate Glasses (Thick Film Resistors)

   G. Abdurakhmanov

   СтатьяElectrical and Thermal Properties of MaterialsJournal of Modern Physics2011Цитирований: 0

   ABIABI:AkademIndex/openalex/2011.article.000311