Работы, цитирующие эту работу

Работ: 2

Работа: Concepts of Backscattering Spectrometry

1. Depth profiles of Sb atoms implanted into Ti

   V. Havránek, V. Hnatowicz, J. Kvítek +3

   СтатьяIon-surface interactions and analysisRadiation effects and defects in solids1991Цитирований: 0

   ABIABI:AkademIndex/openalex/1991.article.000077

2. Microstructure and Rutherford Backscattering Spectrometry of Hard/Lubricant Mo-Ti-Al-N Multilayered Coatings Prepared by Multi-Arc Ion Plating at Low Substrate Rotation

   Zesong Wang, Canxin Tian, A. Tolstogouzov +9

   СтатьяMetal and Thin Film MechanicsCoatings2020Цитирований: 0

   ABIABI:AkademIndex/openalex/2020.article.000837