Работы, цитирующие эту работу

Работ: 2

Работа: A High-Sensitivity System for Cathodoluminescent Studies with the Camebax Electron Probe Microanalyzer

1. Silicon Cluster Aggregation in Silica Layers

   Hans Joachim Fitting, Lena F. Kourkoutis, Roushdey Salh +4

   СтатьяSilicon Nanostructures and PhotoluminescenceDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena2009Цитирований: 0

   ABIABI:AkademIndex/openalex/2009.article.000174

2. Far-Action Defects Formation and Gettering in 6H-SiC Lely Crystals Irradiated by Bi

   D.B. Shustov, E. Kolesnikova, Evgenia V. Kalinina +2

   СтатьяSilicon Carbide Semiconductor TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena2009Цитирований: 0

   ABIABI:AkademIndex/openalex/2009.article.000273