Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits
Ming-Long FanNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanShao‐Yu YangNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanVita Pi‐Ho HuNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanYin-Nien ChenNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanPin SuNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanChing-Te ChuangNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, Taiwan
2014en
ABI
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