← Назад к работе
Работы, цитирующие эту работу
Работ: 2
Работа: Raman Spectroscopy and <i>In Situ</i> XRD Probing of the Thermal Decomposition of Sb<sub>2</sub>Se<sub>3</sub> Thin Films
Structural, morphological, optical, and electrical properties of SbxSey films with different compositions grown by Chemical-molecular beam deposition method from Separate Sb and Se precursors
T.M. Razykov, K.M. Kouchkarov, B. A. Ergashev +3
СтатьяChalcogenide Semiconductor Thin FilmsJournal of Materials Science Materials in Electronics2025Цитирований: 0ABI