B. R. Dzhumaev

1 та иш

Institute of Semiconductor Physics (Ukraine)

1. <title>Depth inhomogeneity of ZnTe, CdZnTe, ZnSe epilayers grown on (001)GaAs of MBE</title>

   E. F. Venger, Yu. G. Sadof’ev, Galina N. Semenova +7

   МақолаAdvanced Semiconductor Detectors and MaterialsProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE19990 иқтибос

   ABIABI:AkademIndex/openalex/1999.article.000170