Eun Dong Kim

1 та иш

Korea Electrotechnology Research Institute (KERI)

1. Structural and Electrical Quality of Silicon Bicrystals Fabricated by a Modified Direct Bonding Technique

   T. S. Argunova, M. Yu. Gutkin, L. S. Kostina +3

   МақолаThin-Film Transistor TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19990 иқтибос

   ABIABI:AkademIndex/openalex/1999.article.000171