А. И. Ковалев
1 та иш
Central Institute of Ferrous Metallurgy, Moscow, 107005, Russia
High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities
O. K. Kuvandikov, Э. У. Арзикулов, А. И. Ковалев +1
МақолаSilicon Nanostructures and PhotoluminescenceJournal of Communications Technology and Electronics20070 иқтибосABI