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E. Duveiller

6 та иш

Authors’ addresses: CIMMYT, Global Wheat Program, México D.F., México

  1. Genetic Improvement and Crop Management Strategies to Minimize Yield Losses in Warm Non‐traditional Wheat Growing Areas due to Spot Blotch Pathogen <i>Cochliobolus sativus</i>

    E. Duveiller, R. C. Sharma

    МақолаWheat and Barley Genetics and PathologyJournal of Phytopathology20092 иқтибос
    ABI

  2. Comparative analyses of spot blotch and tan spot epidemics on wheat under optimum and late sowing period in South Asia

    Suraj Gurung, R. C. Sharma, E. Duveiller +1

    МақолаWheat and Barley Genetics and PathologyEuropean Journal of Plant Pathology20121 иқтибос
    ABI

  3. Photochemical Efficiency and SPAD Value as Indirect Selection Criteria for Combined Selection of Spot Blotch and Terminal Heat Stress in Wheat

    Umesh R. Rosyara, Sushil Raj Subedi, E. Duveiller +1

    МақолаPlant responses to elevated CO2Journal of Phytopathology20100 иқтибос
    ABI

  4. The effect of spot blotch and heat stress on variation of canopy temperature depression, chlorophyll fluorescence and chlorophyll content of hexaploid wheat genotypes

    Umesh R. Rosyara, Sushil Raj Subedi, E. Duveiller +1

    МақолаWheat and Barley Genetics and PathologyEuphytica20100 иқтибос
    ABI

  5. Wheat Stripe Rust Virulence and Varietal Resistance in the Foot Hill Himalayas of Nepal

    Sarala Sharma, E. Duveiller, Chandra Bahadur Karki +3

    МақолаWheat and Barley Genetics and PathologyJournal of Agricultural Science and Technology B20150 иқтибос
    ABI

  6. Control of Helminthosporium leaf blight of spring wheat using seed treatments and single foliar spray in Indo-Gangetic Plains of Nepal

    Dipak Sharma‐Poudyal, R. C. Sharma, E. Duveiller

    МақолаPlant Disease Resistance and GeneticsCrop Protection20160 иқтибос
    ABI