М. Е. Бойко

1 та иш

A.F. Ioffe Physicotechnical Institute RAS

1. Advantages in the Small-Angle Scattering of X-Ray for Studying Optoelectronic Devices within the Frames of ISTC Projects

   М. Е. Бойко, Andrei M. Boiko

   МақолаElectron and X-Ray Spectroscopy TechniquesKey engineering materials20100 иқтибос

   ABIABI:AkademIndex/openalex/2010.article.000271