Chi‐Hsin Huang

1 та иш

Department of Materials Science and Engineering

1. Tunable defect engineering in TiON thin films by multi-step sputtering processes: from a Schottky diode to resistive switching memory

   Teng‐Yu Su, Chi‐Hsin Huang, Yu‐Chuan Shih +5

   МақолаAdvanced Memory and Neural ComputingJournal of Materials Chemistry C20170 иқтибос

   ABIABI:AkademIndex/openalex/2017.article.000071