Physics of Particles and Nuclei Letters

26 та иш

Журнал · ISSN 1531-8567

1. In Situ Mapping of Space Charge Region Activation Dynamics in SiC/Si-Based Heterostructures by KPFM/STS: Role of Interface State Recharging

   M. V. Dolgopolov, N. A. Ivliev, V. V. Radenko +3

   МақолаSilicon Carbide Semiconductor TechnologiesPhysics of Particles and Nuclei Letters20260 иқтибос

   ABIABI:AkademIndex/openalex/2026.article.011837