Investigation of the structure of thin layers of hexadecane on a metal substrate by infrared spectroscopy
V. I. VettegrenA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgA. I. TupitsynaA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg
ABI
Аннотация
Infrared spectroscopy was used to analyze the structure of 0.5–10 μm thick layers of hexadecane on a metal substrate in the range 3000–2800 cm−1. The results suggest that density fluctuations occur in layers between 3 and 10 μm thick, whereas the hexadecane crystallizes in thinner layers.
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