Ушбу иш иқтибос қилган ишлар

4 та иш

Иш: The effect of thermal treatment on the charge-carrier lifetime in nickel-doped silicon

1. Deep impurities in semiconductors

   A. G. Milnes

   Китоб197312 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.364962

2. Deep impurities in semiconductors

   J. Llacer

   Мақола197411 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.364964

3. Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

   D. V. Lang

   Мақола19749 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.424573

4. Electron Spin Resonance in Semiconductors

   Günther Ludwig, H. H. Woodbury

   Боб19622 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.498405