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Ушбу иш иқтибос қилган ишлар

10 та иш

Иш: Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials

  1. Sensitive measurement of optical nonlinearities using a single beam

    Mansoor Sheik‐Bahae, A. A. Said, Tai‐Huei Wei +2

    Мақола1990100 иқтибос
    ABI

  2. Reflection <i>Z</i>-scan technique for measurements of optical properties of surfaces

    Д. В. Петров, Alex Sandro Gomes, Cid B. de Araújo

    Мақола19949 иқтибос
    ABI

  3. Measurement of refractive nonlinearities in GaAs above bandgap energy

    Marcelo Martinelli, Laércio Gomes, R. J. Horowicz

    Мақола20007 иқтибос
    ABI

  4. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

    M. Martinelli, S. Bian, J. R. Leite +1

    Мақола19985 иқтибос
    ABI

  5. Multiphoton absorption and nonlinear refraction of GaAs in the mid-infrared

    W. C. Hurlbut, Yun-Shik Lee, K. L. Vodopyanov +2

    Мақола20074 иқтибос
    ABI

  6. Reflection z‐scan measurements of opaque semiconductor thin films

    R. A. Ganeev, A.I. Ryasnyansky

    МақолаNonlinear Optical Materials Studiesphysica status solidi (a)20042 иқтибос
    ABI

  7. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  8. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  9. Nonresonant Nonlinearity of Silver Nanoparticles

    A. I. Ryasnyanskiı̆

    МақолаNonlinear Optical Materials StudiesJournal of Applied Spectroscopy20051 иқтибос
    ABI

  10. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI