Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
M. MartinelliInstituto de Fı́sica, Universidade de São Paulo, São Paulo, SP, BrasilS. BianInstituto de Fı́sica, Universidade de São Paulo, São Paulo, SP, BrasilJ. R. LeiteInstituto de Fı́sica, Universidade de São Paulo, São Paulo, SP, BrasilR. J. HorowiczInstituto de Fı́sica, Universidade de São Paulo, São Paulo, SP, Brasil
1998en
ABI
Аннотация
We demonstrate a new experimental method which allows the measurement of the nonlinear optic index in absorptive media with great sensitivity. In this technique the reflection from a polarized Gaussian laser beam close to the Brewster angle is measured. A sensitivity enhancement factor of 30 with respect to other techniques is observed for an optical crystal, and higher values are possible to be obtained.
Ҳали таржима қилинмаган
Идентификаторлар
Иқтибослар ва манбалар
5 та иқтибос0 та фойдаланилган манба