Ушбу ишга иқтибос қилган ишлар

5 та иш

Иш: Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

1. Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials

   R. A. Ganeev

   МақолаNonlinear Optical Materials StudiesApplied Physics B20082 иқтибос

   ABIABI:AkademIndex/openalex/2008.article.000067

2. Reflection z‐scan measurements of opaque semiconductor thin films

   R. A. Ganeev, A.I. Ryasnyansky

   МақолаNonlinear Optical Materials Studiesphysica status solidi (a)20042 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.162154

3. Study of the nonlinear refractive index of chalcogenide films by the RZ-scan method

   A. I. Ryasnyanskiı̆

   МақолаNonlinear Optical Materials StudiesOptics and Spectroscopy20052 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.524838

4. Nonresonant Nonlinearity of Silver Nanoparticles

   A. I. Ryasnyanskiı̆

   МақолаNonlinear Optical Materials StudiesJournal of Applied Spectroscopy20051 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.360587

5. Ion synthesis and optical properties of gold nanoparticles in an Al2O3 matrix

   А. Л. Степанов, C. Marques, E. Alves +5

   МақолаNonlinear Optical Materials StudiesTechnical Physics20060 иқтибос

   ABIABI:AkademIndex/openalex/2006.article.000165