Асосий контентга ўтиш
AkademIndex

Маҳсулотлар

Ишлаб чиқувчилар учун

AkademBaseЭкотизим учун очиқ API
← Ишга қайтиш

Ушбу иш иқтибос қилган ишлар

14 та иш

Иш: On the unimolecular decay and mechanism of formation of Si+ n cluster ions

  1. Sputtering by Particle Bombardment III

    R. Behrisch, K. Wittmaack, Wittmaack, Klaus +1

    Китоб199118 иқтибос
    ABI

  2. Ion microprobe for studying cluster ion decay reactions

    A. D. Bekkerman, Н. Х. Джемилев, V. M. Rotstein

    Мақола199016 иқтибос
    ABI

  3. Unimolecular reactions

    P. G. Ashmore, Peter Robinson

    Боб197515 иқтибос
    ABI

  4. Fragmentation of sputtered Si n O+ m clusters: Release kinetic and dissociation energies

    Н. Х. Джемилев, С. Ф. Коваленко, L.F. Lifanova +2

    МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics200811 иқтибос
    ABI

  5. Shock wave mechanism for cluster emission and organic molecule desorption under heavy ion bombardment

    I.S. Bitensky, E.S. Parilis

    Мақола19878 иқтибос
    ABI

  6. Mechanism for the formation of molecular clusters under ion sputtering

    Н. Х. Джемилев

    МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20127 иқтибос
    ABI

  7. On the energy distribution of sputtered dimers

    G. P. Können, A. Tip, A.E. De Vries

    Мақола19745 иқтибос
    ABI

  8. Decay rate constants of sputtered vanadium oxide clusters

    С. Е. Максимов, Н. Х. Джемилев, С. Ф. Коваленко +2

    МақолаTransition Metal Oxide NanomaterialsBulletin of the Russian Academy of Sciences Physics20144 иқтибос
    ABI

  9. Energy spectrum of a 2D Dirac electron in the presence of a constant magnetic field

    Vı́ctor M. Villalba, A. Rincon Maggiolo

    Мақола20014 иқтибос
    ABI

  10. Fragmentation processes of vanadium and niobium oxide clusters sputtered by ion bombardment

    Н. Х. Джемилев, С. Ф. Коваленко, С. Е. Максимов +2

    МақолаCatalytic Processes in Materials ScienceJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20143 иқтибос
    ABI

  11. Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry

    C.-E. Richter, Michael Trapp

    Мақола19813 иқтибос
    ABI

  12. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  13. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  14. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI