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6 та иш

Иш: Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

  1. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    МақолаIon-surface interactions and analysisSilicon202111 иқтибос
    ABI

  2. Formation of defects on the surface of LiF crystals under irradiation with different ions mass

    Utkirjon Sharopov, Umid Gopparov, K. Yu. Rashidov +8

    МақолаIon-surface interactions and analysisRadiation effects and defects in solids20229 иқтибос
    ABI

  3. Investigation of Defect InP(001) Surface by Low Energy Ion Scаttering Spectroscopy

    М. K. Kаrimov, F.O. Kuryozov, Sh.R. Sadullaev +2

    МақолаIntegrated Circuits and Semiconductor Failure AnalysisMaterials science forum20228 иқтибос
    ABI

  4. Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

    Utkirjon Sharopov, Kulwinder Kaur, М. К. Курбанов +5

    МақолаIon-surface interactions and analysisSurface and Interface Analysis20226 иқтибос
    ABI

  5. Analysis of InGaP(001) surface by the low energy ion scattering spectroscopy

    Uchkun Kutliev, М. K. Kаrimov, F.O. Kuryozov +1

    МақолаIon-surface interactions and analysisJournal of Physics Conference Series20214 иқтибос
    ABI

  6. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    ПрепринтSemiconductor materials and devicesResearch Square20211 иқтибос
    ABI