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5 та иш

Иш: Study of the electrophysical properties of higher manganese silicide (Mn4Si7) thin films and their temperature dependence

  1. Correlation between thickness-dependent morphology, phase structure, and vibrational properties of TiO2 thin films deposited via DC magnetron sputtering: A multi-technique characterization approach

    Б.Д. Игамов, I. R. Bekpulatov, A.M. Normamatov +2

    МақолаZnO doping and propertiesNext Materials20250 иқтибос
    ABI

  2. Investigation of the formation mechanisms, crystallographic evolution and microstructural characteristics of the ZrSi2 phase on the Si(111) surface

    Б.Д. Игамов, I. R. Bekpulatov, A.I. Kamardin +4

    МақолаSemiconductor materials and interfacesNext Materials20250 иқтибос
    ABI

  3. Comprehensive analysis of thickness-dependent structural, morphological, and optical properties of TiO2 based thin films

    B.D. Igamov, I.R. Bekpulatov, A.M. Normamatov +3

    МақолаTiO2 Photocatalysis and Solar CellsResults in Optics20260 иқтибос
    ABI

  4. Study of polymer coatings implanted with high-energy ion beams

    B.D. Igamov, A.I. Kamardin, I.Yu Kochemasov +4

    МақолаPolymer Nanocomposite Synthesis and IrradiationNext Materials20260 иқтибос
    ABI

  5. Study of the effect of thermal treatment OF Mn4Si7 and CoSi2 thin films using an infrared lamp in a high-temperature furnace in inert gas environments (Ar, Kr, Xe) On their crystal structure

    B.D. Igamov, A.I. Kamardin, I.R. Bekpulatov +5

    МақолаSemiconductor materials and interfacesSolid State Sciences20260 иқтибос
    ABI