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Иш: Investigation of electron irradiation effects on defect states in silicon using Raman and infrared spectroscopy methods
Raman spectroscopy of PtSi formation at the Pt/Si(100) interface
J. C. Tsang, Y. Yokota, R. Matz +1
Мақола19846 иқтибосABIOne and two-phonon Raman scattering from nanostructured silicon
Igor Iatsunskyi, Grzegorz Nowaczyk, Stefan Jurga +3
Мақола20155 иқтибосABIInitial Phase formation at the Interface of Ni, Pd, or Pt and Si
R. J. Nemanich, Chia-Lun Tsai, B. Stafford +2
Мақола19833 иқтибосABI