Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Depth profiles of metal ions implanted in dielectrics at low energies

1. Saturated absorption and nonlinear refraction of silicate glasses doped with silver nanoparticles at 532 nm

   R. A. Ganeev, A.I. Ryasnyansky, А. Л. Степанов +1

   МақолаNonlinear Optical Materials StudiesOptical and Quantum Electronics20046 иқтибос

   ABIABI:AkademIndex/openalex/2004.article.000016

2. Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures

   З. А. Исаханов, Tulkin Kodirov, A. S. Halmatov +3

   МақолаMetal and Thin Film MechanicsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20173 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.495101