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18 та иш

Иш: Reflection z‐scan measurements of opaque semiconductor thin films

  1. Сарлавҳасиз

    Бошқа1117 иқтибос
    ABI

  2. Sensitive measurement of optical nonlinearities using a single beam

    Mansoor Sheik‐Bahae, A. A. Said, Tai‐Huei Wei +2

    Мақола1990100 иқтибос
    ABI

  3. Theoretical study on the closed-aperture Z-scan curves in the materials with nonlinear refraction and strong nonlinear absorption

    Xiaodong Li, Shengli Guo, Hui‐Tian Wang +1

    Мақола200132 иқтибос
    ABI

  4. Investigation of nonlinear refraction and nonlinear absorption of semiconductor nanoparticle solutions prepared by laser ablation

    R. A. Ganeev, A.I. Ryasnyansky, R. I. Tugushev +1

    Мақола200317 иқтибос
    ABI

  5. Dispersion of bound electron nonlinear refraction in solids

    Mansoor Sheik‐Bahae, D. C. Hutchings, David J. Hagan +1

    Мақола199113 иқтибос
    ABI

  6. Optical nonlinearities and photo-excited carrier lifetime in CdS at 532 nm

    H.P Li, C. H. Kam, Yee Loy Lam +1

    Мақола200112 иқтибос
    ABI

  7. Eclipsing Z-scan measurement of λ/10^4 wave-front distortion

    T. Xia, David J. Hagan, Mansoor Sheik‐Bahae +1

    Мақола199411 иқтибос
    ABI

  8. Nonlinear refraction in CS2

    R. A. Ganeev, A.I. Ryasnyansky, M. Baba +5

    МақолаNonlinear Optical Materials StudiesApplied Physics B20049 иқтибос
    ABI

  9. Measurement of nonlinear refractive index by time-resolved z-scan technique

    Tadashi Kawazoe, Hitoshi Kawaguchi, Jun Inoue +2

    Мақола19999 иқтибос
    ABI

  10. Reflection <i>Z</i>-scan technique for measurements of optical properties of surfaces

    Д. В. Петров, Alex Sandro Gomes, Cid B. de Araújo

    Мақола19949 иқтибос
    ABI

  11. Measurements of nondegenerate optical nonlinearity using a two-color single beam method

    H. Ma, Anderson S. L. Gomes, Cid B. de Araújo

    Мақола19918 иқтибос
    ABI

  12. Measurement of refractive nonlinearities in GaAs above bandgap energy

    Marcelo Martinelli, Laércio Gomes, R. J. Horowicz

    Мақола20007 иқтибос
    ABI

  13. Variations of nonlinear optical characteristics of C60 thin films at 532 nm

    R. A. Ganeev, A.I. Ryasnyansky, В. И. Редкоречев +3

    МақолаNonlinear Optical Materials StudiesOptics Communications20036 иқтибос
    ABI

  14. Measurement of refractive-index change at a liquid–solid interface close to the critical angle

    M. Martinelli, Marcos Gugliotti, R. J. Horowicz

    Мақола20005 иқтибос
    ABI

  15. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

    M. Martinelli, S. Bian, J. R. Leite +1

    Мақола19985 иқтибос
    ABI

  16. Reflection of a Gaussian beam from a saturable absorber

    Д. В. Петров, Anderson S. L. Gomes, Cid B. de Araújo

    Мақола19963 иқтибос
    ABI

  17. Optical properties of amorphous multilayers

    H. Hamanaka, Satoshi Konagai, K. Murayama +2

    Мақола19963 иқтибос
    ABI

  18. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI