Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Variations in the electronic structure of the silicon near-surface region during implantation of phosphorus and boron ions

1. Investigation of Coatings Formed by Thermal Oxidation on Monocrystalline Silicon

   Bakhrom Igаmоv, Gunel Imanova, A.I. Kamardin +1

   МақолаSurface Roughness and Optical MeasurementsIntegrated ferroelectrics202412 иқтибос

   ABIABI:AkademIndex/openalex/2024.article.000603

2. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

   K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

   МақолаChalcogenide Semiconductor Thin Films20242 иқтибос

   ABIABI:AkademIndex/openalex/2024.article.003101