Ушбу ишга иқтибос қилган ишлар

5 та иш

Иш: Estimation of lattice strain in ZnO nanoparticles: X-ray peak profile analysis

1. Study of Mn4Si7 silicide crystals obtained by hot isostatic pressing and spark plasma sintering methods in an X-ray diffractometer

   Б.Д. Игамов, A.I. Kamardin, D.Kh. Nabiev +7

   МақолаSemiconductor materials and interfacesJournal of Materials Science Materials in Engineering20254 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.000878

2. Аnаlysis оf Na-А zeоlite bаsed оn kаоlin using аn X-rаy diffrаctоmeter

   Muxlis Оydinоv, Bakhrom Igаmоv, I. R. Bekpulatov +2

   МақолаElectric Power Systems and ControlChemical Bulletin of Kazakh National University20242 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.267085

3. Effects of La3+ doping on the structural, vibrational, elemental, and dielectric characteristics of Sr-Ba-Zr2 R-type hexaferrite

   Iqra Manzoor, Muhammad Irfan, Raqiqa Tur Rasool +8

   МақолаMagnetic Properties and Synthesis of FerritesCeramics International20240 иқтибос

   ABIABI:AkademIndex/openalex/2024.article.000897

4. The influence of gamma radiation on the structure of solid solutions of CaF2:SrF2:YbF3 crystals and ceramics

   Sokhiba Boyboboeva, И. Нуритдинов, M. Kh. Ashurov +1

   МақолаLuminescence Properties of Advanced MaterialsMicro and Nanostructures20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.010336

5. Study of the temperature dependence of the electrophysical and crystal structure of a thin coating of manganese silicide

   B.D. Igamov, A.I. Kamardin, I.R. Bekpulatov +1

   МақолаSemiconductor materials and interfacesMaterials Today Communications20260 иқтибос

   ABIABI:AkademIndex/openalex/2026.article.000612