Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. GoldsteinLehigh University, Bethlehem, USADale E. NewburyNational Bureau of Standards, USAPatrick EchlinUniversity of Cambridge, Cambridge, EnglandDavid C. JoyCharles E. FioriNational Institutes of Health, Bethesda, USAEric LifshinGeneral Electric Corporate Research and Development, Schenectady, USA
1981en
ABI
Аннотация
Аннотация мавжуд эмас.
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