Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Scanning Electron Microscopy and X-Ray Microanalysis

1. Study of ion-bombardment-induced surface topography of silver by stereophotogrammetric method

   I. M. Fayazov, V. N. Sokolov

   МақолаIon-surface interactions and analysisRadiation effects and defects in solids19920 иқтибос

   ABIABI:AkademIndex/openalex/1992.article.000019

2. New potential applications of scanning electron microscopy to studying InAsSb/InAsSbP lasers

   В. А. Соловьев, M. P. Mikhaĭlova, M. V. Stepanov +2

   МақолаSpectroscopy and Laser ApplicationsTechnical Physics Letters19970 иқтибос

   ABIABI:AkademIndex/openalex/1997.article.000204