Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Microanalyses on the RuO ₂ Particle–Glass Matrix Interface in Thick‐Film Resistors with Piezoresistive Effects

1. On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors). 3. The Minimum of Temperature Dependence of Resistivity

   G. Abdurakhmanov

   МақолаElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics20145 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.405405

2. Impact of Ruthenium Diffusion on the Electrical Properties of Thick Film Resistors

   Avazbek T. Dekhkonov, G. Abdurakhmanov, Mukhriddin E. Tursunov +5

   МақолаElectrical and Thermal Properties of MaterialsEast European Journal of Physics20251 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.002402