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Иш: A C₆₀ Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

1. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.413689

2. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 иқтибос

   ABIABI:AkademIndex/openalex/2008.article.000234

3. SIMS of silicon bombarded with Sb+ m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 иқтибос

   ABIABI:AkademIndex/openalex/2014.article.000619