Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Thermal Conductivity Measurement of Thermally-Oxidized SiO2 Films on a Silicon Wafer Using a Thermo-Reflectance Technique

1. Combined Influence of Gate Oxide and Back Oxide Materials on Self-Heating and DIBL Effect in 2D MOS2-Based MOSFETs

   A. É. Atamuratov, Khushnudbek Sh. Saparov, Ahmed Yusupov +1

   Мақола2D Materials and ApplicationsApplied Sciences20231 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.439504

2. Self heating and DIBL effects in 2D MoS2 based MOSFET with different gate oxide and back oxide materials

   A. É. Atamuratov, X. Sh. Saparov, Jean Chamberlain Chedjou +2

   Мақола2D Materials and Applications20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.001865