Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices

1. Study of polycrystalline CdTe films by contact and contactless pulsed photo-ionization spectroscopy

   E. Gaubas, T. Čeponis, D. Dobrovolskas +6

   МақолаChalcogenide Semiconductor Thin FilmsThin Solid Films20184 иқтибос

   ABIABI:AkademIndex/openalex/2018.article.000311

2. Investigation of the surface recombination rate in polycrystalline films from the A⁶B⁶ compound by the MW-PC method

   Nodir Alimov, J. Vaitkus, Otajonov Salim +1

   МақолаAdvanced Semiconductor Detectors and MaterialsJournal of Physics Conference Series20221 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.551349