Ушбу ишга иқтибос қилган ишлар

5 та иш

Иш: Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

1. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.415077

2. Cluster projectile ions used for the SIMS analysis of silicon

   Sh.Dj. Akhunov, С. Н. Морозов

   МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 иқтибос

   ABIABI:AkademIndex/openalex/2013.article.000207

3. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 иқтибос

   ABIABI:AkademIndex/openalex/2008.article.000234

4. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisTechnical Physics20130 иқтибос

   ABIABI:AkademIndex/openalex/2013.article.000300

5. SIMS of silicon bombarded with Sb+ m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 иқтибос

   ABIABI:AkademIndex/openalex/2014.article.000619