Мақола

Determination of ZnSe(Te) stoichiometry and dopant content by X-ray analysis

N. M. MukhamedshinaInstitute of Nuclear Physics, Ulugbek, Tashkent, 702132, UzbekistanA. A. MirsagatovaInstitute of Nuclear Physics, Ulugbek, Tashkent, 702132, UzbekistanВ. Г. ЗиновьевInstitute of Nuclear Physics, Ulugbek, Tashkent, 702132, Uzbekistan

Journal of Radioanalytical and Nuclear Chemistryjournal2005en

ABI

Аннотация

Аннотация мавжуд эмас.

Мавзулар

Chalcogenide Semiconductor Thin Films Quantum Dots Synthesis And Properties Advanced Semiconductor Detectors and Materials

Идентификаторлар

DOI: 10.1007/s10967-005-0680-2

Иқтибослар ва манбалар

1 та иқтибос0 та фойдаланилган манба

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