Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Electron-Hole Recombination Statistics in Semiconductors through Flaws with Many Charge Conditions

1. Statistics of Inter‐Impurity Recombination of Electrons and Holes in Semiconductors

   P. M. Karageorgy‐Alkalaev, A. Yu. Leĭderman

   МақолаSilicon and Solar Cell Technologiesphysica status solidi (b)19685 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.531304

2. Influence of X-irradiation on silicon Schottky diodes

   U.A. Shakirov, Marat S. Yunusov

   МақолаSilicon and Solar Cell Technologiesphysica status solidi (a)19760 иқтибос

   ABIABI:AkademIndex/openalex/1976.article.000036