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Иш: Influence of deep impurity levels on double injection in semiconductors

1. Double-injection currents in Zn-compensated silicon pin structures

   P. M. Karageorgy‐Alkalaev, I. Z. Karimova, P. I. Knigin +1

   МақолаSilicon and Solar Cell Technologiesphysica status solidi (a)19766 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.496739