Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

1. Characterising lateral capacitance of MNOSFET with localised trapped charge in nitride layer

   A. É. Atamuratov, Zamira Atamuratova, А. Yusupov +1

   МақолаSemiconductor materials and devicesResults in Physics20183 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.570280

2. Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer

   Zamira Atamuratova, А. Yusupov, B. O. Khalikberdiev +1

   МақолаSemiconductor materials and devicesTechnical Physics20193 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.570281