Ушбу ишга иқтибос қилган ишлар

3 та иш

Иш: Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

1. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.415077

2. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 иқтибос

   ABIABI:AkademIndex/openalex/2008.article.000234

3. SIMS of silicon bombarded with Sb+ m cluster ions

   С. Н. Морозов, У. Х. Расулев

   МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 иқтибос

   ABIABI:AkademIndex/openalex/2014.article.000619