Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Technique for rapid inspection of hermetic seals of microelectronic packages using shearography

1. Digital Shearograph for Detecting Defect in Materials

   Z. T. Azamatov, V. E. Gaponov, Akylbek A. Jeenbekov +1

   МақолаOptical measurement and interference techniquesRussian Microelectronics20231 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.403494

2. HOLOGRAPHIC PROPERTIES OF CHALCOGENIDE GLASSY SEMICONDUCTOR (CGS) FILMS

   Z. T. Azamatov, Mira Ruzimovna Bekchanova, Abror B. Bakhromov

   МақолаPhase-change materials and chalcogenides20240 иқтибос

   ABIABI:AkademIndex/openalex/2024.article.009652