Determining the potential barrier presented by the interfacial layer from the temperature induced I–V characteristics in Al/p-Si Structure with native oxide layer
Muhammed Can ÖZDEMİRInstitute of Graduate Education, Istanbul Medeniyet University, Nanoscience and Nanoengineering Department, 34700, Istanbul, TurkeyÖmer Sevgi̇li̇Vocational School of Health Services, Bingöl University, 12000, Bingöl, Turkeyİkram OrakVocational School of Health Services, Bingöl University, 12000, Bingöl, TurkeyA. TürütEngineering Physics Department, Faculty of Engineering and Natural Sciences, Istanbul Medeniyet University, 34700, Istanbul, Turkey
2020en
ABI
Аннотация
Аннотация мавжуд эмас.
Идентификаторлар
Иқтибослар ва манбалар
2 та иқтибос0 та фойдаланилган манба