Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Study of Mn4Si7 Silicide Alloys Produced Under Different Conditions Using an X-ray Diffractometer

1. Investigation of the formation mechanisms, crystallographic evolution and microstructural characteristics of the ZrSi2 phase on the Si(111) surface

   Б.Д. Игамов, I. R. Bekpulatov, A.I. Kamardin +4

   МақолаSemiconductor materials and interfacesNext Materials20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.009153

2. Microstructural, phase and electrophysical properties of TiSi2 alloy synthesized by Spark Plasma Sintering

   B.D. Igamov, I.R. Bekpulatov, A.M. Normamatov +3

   МақолаSemiconductor materials and interfacesJournal of Alloys and Compounds20260 иқтибос

   ABIABI:AkademIndex/openalex/2026.article.008556