R. M. Chrenko

1 ta ish

General Electric (United States)

1. Defects in Irradiated Silicon. II. Infrared Absorption of the Si-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>A</mml:mi></mml:math>Center

   J. W. Corbett, G. D. Watkins, R. M. Chrenko +1

   Maqola19612 iqtibos

   ABIABI:AkademIndex/2026.other.360564