J. W. Corbett

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General Electric (United States)

1. Defects in Irradiated Silicon: Electron Paramagnetic Resonance and Electron-Nuclear Double Resonance of the Si-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>E</mml:mi></mml:math>Center

   G. D. Watkins, J. W. Corbett

   Maqola19645 iqtibos

   ABIABI:AkademIndex/2026.other.360563