C. T. Sah

1 ta ish

University of Illinois Urbana-Champaign

1. Frequency dependence of the reverse-biased capacitance of gold-doped silicon P⁺N step junctions

   C. T. Sah, V.G.K. Reddi

   Maqola19642 iqtibos

   ABIABI:AkademIndex/2026.other.653539